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Direct Backward Calculation from X-Ray Double Crystal Topographs

✍ Scribed by Lerche, V. ;Dörnfelder, P. ;Härtwig, J.

Publisher: John Wiley and Sons
Year: 1991
Tongue: English
Weight: 818 KB
Volume: 128
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211280202

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## Abstract We propose a common description of the full widths at half maximum of X‐ray diffraction peaks obtained in different scans of triple‐crystal diffractometry and as well as for glancing incidence and glancing exit double‐crystal measurements. Calculations are compared with measurements of