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Diode-Laser Spectroscopy: Line Profiles of H2O in the Region of 1.39 μm

✍ Scribed by Muriel Lepère; Annie Henry; Alain Valentin; Claude Camy-Peyret

Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
136 KB
Volume
208
Category
Article
ISSN
0022-2852

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✦ Synopsis

Using a stabilized diode-laser spectrometer, we have studied the line profiles of water vapor near 7185.59 cm -1 . With low pressures of pure gas (≤1 Torr) in a White-type cell, we have deduced the line intensities using the Voigt profile. This study shows clear differences between experimental and calculated lines described by a Voigt profile when the pressure increases. For water vapor in mixtures with N 2 , O 2 , Ar, or He, we have determined the collisional broadening coefficients, taking into account the collisional narrowing (Dicke effect). The narrowing parameters have been determined using soft (Galatry) or hard (Rautian and Sobel'man) collision models and compared to the dynamic friction coefficient.

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