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Diode Laser Spectroscopy of Water Vapor in 1.8 μM: Line Profile Measurements

✍ Scribed by V.G. Avetisov; A.I. Nadezhdinskii; A.N. Khusnutdinov; P.M. Omarova; M.V. Zyrianov

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
363 KB
Volume
160
Category
Article
ISSN
0022-2852

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✦ Synopsis

A diode laser spectrometer has been used for high accuracy (\mathrm{H}_{2} \mathrm{O}) line profile measurements near (5475 \mathrm{~cm}^{-1}). Measured lineshapes have been least-squares fitted by Voigt profile with a floating Gaussian component. Gaussian component pressure dependence resulting from the Dicke narrowing effect is observed. Line intensities, self- and air-induced broadenings, and shifts of five water vapor lines are presented. (C) 1993 Academic Press, Inc.

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