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Digital integrated circuit testing from a quality persepctive: Author: Eugene R. Hnatek Publisher: International Thomson Publishing Berckshire House 168-173 High Holborn London WC1V 7AA England Price: 41.50 GBP (ISBN: 0-442-00643-8) Published in 1993

✍ Scribed by Z. Nikolić

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 96 KB
Volume: 34
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(94)90057-4

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