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Digital integrated circuit testing from a quality perspective: Author: Eugene R. Hnatek Publishers: International Thomson Publishing Berkshire House, 168 - 173 High Holborn, London, WC1V 7AA, England. Price: £ 41.50. (ISBN 0 - 442 - 00643 - 8) Published August 1993

✍ Scribed by G.W.A.D.


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
76 KB
Volume
34
Category
Article
ISSN
0026-2714

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