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Digital Device Error Rate Trends in Advanced CMOS Technologies

✍ Scribed by Gadlage, Matthew J.; Eaton, Paul H.; Benedetto, Joseph M.; Carts, Marty; Zhu, Vivian; Turflinger, Thomas L.


Book ID
121232902
Publisher
IEEE
Year
2006
Tongue
English
Weight
211 KB
Volume
53
Category
Article
ISSN
0018-9499

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