Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology

✍ Scribed by Jagannathan, S.; Loveless, T. D.; Bhuva, B. L.; Gaspard, N. J.; Mahatme, N.; Assis, T.; Wen, S.-J; Wong, R.; Massengill, L. W.

• Book ID: 119950489
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 988 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2012.2223827