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Diffraction and X-ray reflection at grazing incidence. Possibilities of studying multilayer thin-film structures

✍ Scribed by Golovin, A. L. ;Imamov, R. M. ;Melikyan, O. G.

Book ID: 114500250
Publisher: International Union of Crystallography
Year: 1989
Tongue: English
Weight: 389 KB
Volume: 22
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889889003882

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