✦ LIBER ✦

Different luminescent properties of C+-implanted SiO2 films grown by thermal oxidation and PECVD

✍ Scribed by J. Zhao; D.S. Mao; Z.X. Lin; B.Y. Jiang; Y.H. Yu; X.H. Liu; G.Q. Yang

Book ID: 117358647
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 140 KB
Volume: 38
Category: Article
ISSN: 0167-577X
DOI: 10.1016/s0167-577x(98)00182-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Photoluminescence properties of thermal

Photoluminescence properties of thermal SiO2 films implanted by silicon and nitrogen ions

✍ J Zhao; Y.H Yu; D.S Mao; Z.X Lin; B.Y Jiang; G.Q Yang; X.H Liu; Shichang Zou 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 127 KB

Spectroellipsometric investigation of op

Spectroellipsometric investigation of optical properties of SiO2 grown by wet thermal oxidation

✍ C Flueraru; M Gartner; O Buiu; R Radoi; I Cernica; P Imperia; S Schrader 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 157 KB

Synthesis of luminescent particles in Si

Synthesis of luminescent particles in SiO2 films by sequential Si and C ion implantation

✍ O González-Varona; C Bonafos; M López; B Garrido; A Pérez-Rodrı́guez; J.R Morant 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 233 KB

Scintillation and luminescent properties

Scintillation and luminescent properties of undoped and Ce3+ doped Y2SiO5 and Lu2SiO5 single crystalline films grown by LPE method

✍ Yu. Zorenko; V. Gorbenko; V. Savchyn; T. Voznyak; V.V. Gorbenko; M. Nikl; J.A. M 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 763 KB

Structural and mechanical properties of

Structural and mechanical properties of a-C:H and Si doped a-C:H thin films grown by LF-PECVD

✍ C. Chouquet; G. Gerbaud; M. Bardet; S. Barrat; A. Billard; F. Sanchette; C. Ducr 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 678 KB

The structural and electrical properties

The structural and electrical properties of TiO2 thin films prepared by thermal oxidation

✍ P. Chowdhury; Harish C. Barshilia; N. Selvakumar; B. Deepthi; K.S. Rajam; Ayan R 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 515 KB

Thin films of TiO 2 were grown on n-type Si substrate by thermal oxidation of Ti films deposited by dc sputtering. The phase purity of TiO 2 was confirmed by Raman spectroscopy, and secondary ion mass spectroscopy was used to analyze the interfacial and chemical composition of the TiO 2 thin films.