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Dielectric relaxation and defect analysis of Ta2O5 thin films

✍ Scribed by Ezhilvalavan, S; Tsai, Ming Shiahn; Tseng, Tseung Yuen; Tsai, Ming Shiahn


Book ID
111872908
Publisher
Institute of Physics
Year
2000
Tongue
English
Weight
111 KB
Volume
33
Category
Article
ISSN
0022-3727

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