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Dielectric function of disorder in high-fluence helium-implanted silicon

✍ Scribed by P. Petrik; M. Fried; T. Lohner; N.Q. Khánh; P. Basa; O. Polgár; C. Major; J. Gyulai; F. Cayrel; D. Alquier

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 576 KB
Volume: 253
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2006.10.054

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