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Dielectric function of amorphous silicon films, its oxidation and voids, studied by electron spectroscopy

✍ Scribed by H. Richter; B. Schröder; J. Geiger


Book ID
118331590
Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
499 KB
Volume
43
Category
Article
ISSN
0022-3093

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