𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Dielectric breakdown I: A review of oxide breakdown

✍ Scribed by J.F. Verweij; J.H. Klootwijk


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
848 KB
Volume
27
Category
Article
ISSN
0026-2692

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Intrinsic dielectric breakdown of ultra-
✍ S. Lombardo πŸ“‚ Article πŸ“… 2001 πŸ› Elsevier Science 🌐 English βš– 355 KB

We have investigated the dynamics of intrinsic dielectric breakdown (BD) in SiO thin films of thickness in the range 2 from 35 to 3 nm. BD is obtained under constant voltage Fowler-Nordheim stress at fields between 10 and 12.5 MV/ cm. As a function of oxide thickness we have followed with high time

Dielectric breakdown of cell membranes
✍ U. Zimmermann; G. Pilwat; D. Bresgen πŸ“‚ Article πŸ“… 1980 πŸ› Springer 🌐 English βš– 65 KB