𝔖 Bobbio Scriptorium
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Carbon Incorporation during the Dielectric Breakdown Process of Silicon Oxide

✍ Scribed by Najmi, O.; Montero, I.; Galán, L.; Albella, J. M.


Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
320 KB
Volume
25
Category
Article
ISSN
0142-2421

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