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Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out

✍ Scribed by Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.

Book ID: 114607635
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 939 KB
Volume: 30
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2011.2165071

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