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Device quality ZnO grown using a Filtered Cathodic Vacuum Arc

✍ Scribed by Salim Elzwawi; Hyung Suk Kim; Robert Heinhold; Max Lynam; Gary Turner; Jim G. Partridge; Dougal G. McCulloch; Roger J. Reeves; Martin W. Allen

Book ID: 116833939
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 472 KB
Volume: 407
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2011.08.074

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