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Device for measuring slight nonlinearities in a sawtooth voltage

โœ Scribed by V. A. Kulikov

Book ID
112415071
Publisher
Springer US
Year
1972
Tongue
English
Weight
299 KB
Volume
15
Category
Article
ISSN
0543-1972

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An alternative method for measuring flat
An alternative method for measuring flatband voltage in MOS devices
โœ A Benfdila; A Chikouche ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 102 KB

The present paper describes an experimental method that can be used to measure the flatband voltage value in MOS devices. The method is based on the detection of the non-steady-state / steady-state transition of the surface potential at the Si-SiO interface when it is pulsed by a voltage signal. Thi