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Methods and devices for anode voltage measurement in x-ray apparatuses

โœ Scribed by D. A. Muslimov; A. S. Lelyukhin


Publisher
Springer US
Year
2011
Tongue
English
Weight
167 KB
Volume
45
Category
Article
ISSN
0006-3398

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โœ A Benfdila; A Chikouche ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 102 KB

The present paper describes an experimental method that can be used to measure the flatband voltage value in MOS devices. The method is based on the detection of the non-steady-state / steady-state transition of the surface potential at the Si-SiO interface when it is pulsed by a voltage signal. Thi