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Development of high coercivity magnetic force microscopy tips

โœ Scribed by S.H Liou; Y.D Yao


Book ID
114228884
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
660 KB
Volume
190
Category
Article
ISSN
0304-8853

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๐Ÿ“œ SIMILAR VOLUMES


A Magnetic Material of High Coercive For
โœ GOTTSCHALK, V. H.; DAVIS, C. W. ๐Ÿ“‚ Article ๐Ÿ“… 1933 ๐Ÿ› Nature Publishing Group ๐ŸŒ English โš– 102 KB
Magnetically refined tips for Scanning F
โœ R. Jumpertz; P. Leinenbach; A.W.A. van der Hart; J. Schelten ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 372 KB

Cantilever probes with integrated tips are commercially available. They are routinely used for atomic force microscopy (AFM). For such probes a magnetic refinement of the silicon tip has been developed which results in a deposition of ferromagnetic materials like Nickel or CrCoTa at the top area of