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Low-noise magnetic force microscopy with high resolution by tip cooling

✍ Scribed by Saito, H.; Sunahara, R.; Rheem, Y.; Ishio, S.

Book ID: 114650830
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 205 KB
Volume: 41
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.2005.859891

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