Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment

✍ Scribed by Rode, S.; Stark, R.; Lubbe, J.; Troger, L.; Schutte, J.; Umeda, K.; Kobayashi, K.; Yamada, H.; Kuhnle, A.

• Book ID: 119940896
• Publisher: American Institute of Physics
• Year: 2011
• Tongue: English
• Weight: 900 KB
• Volume: 82
• Category: Article
• ISSN: 0034-6748
• DOI: 10.1063/1.3606399