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Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions

โœ Scribed by Fukuma, Takeshi; Jarvis, Suzanne P.


Book ID
120366446
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
1007 KB
Volume
77
Category
Article
ISSN
0034-6748

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