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Development of a new type of self-scanned electron image sensing integrated circuit

✍ Scribed by Hatfield, J.V.; York, T.A.; Comer, J.; Hicks, P.J.

Book ID: 119774139
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 850 KB
Volume: 24
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.32029

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