Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: a comparison study

✍ Scribed by Zhi Chen; Kangguo Cheng; Jinju Lee; Lyding, J.W.; Hess, K.; Chetlur, S.

• Book ID: 114538640
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 82 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.915732