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Determination of thickness, refractive index, and spectral scattering of an inhomogeneous thin film with rough interfaces

✍ Scribed by Pradeep, J. Anto; Agarwal, Pratima

Book ID
120294373
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
429 KB
Volume
108
Category
Article
ISSN
0021-8979

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Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of LloydΓ•s interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me