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Determination of the trapped charge distribution in scaled silicon nitride MONOS nonvolatile memory devices by tunneling spectroscopy

✍ Scribed by Anirban Roy; Marvin H. White

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 447 KB
Volume: 34
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(91)90104-7

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