Determination of the trapped charge distribution in scaled silicon nitride MONOS nonvolatile memory devices by tunneling spectroscopy : Anirban Roy and Marvin H. White. Solid-St. Electron. 34(10), 1083 (1991)

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 110 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90749-b