Determination of the third- and fifth-order nonlinear refractive indices in InN thin films

✍ Scribed by Zhang, Z. Q.; He, W. Q.; Gu, C. M.; Shen, W. Z.; Ogawa, H.; Guo, Q. X.

• Book ID: 120466077
• Publisher: American Institute of Physics
• Year: 2007
• Tongue: English
• Weight: 448 KB
• Volume: 91
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2813637

✦ Synopsis

We have combined the reflection and transmission Z-scan (RZ- and TZ-scans) techniques under femtosecond laser at 800nm to extract both the third- and fifth-order nonlinear refractive indices (n2 and n4) in InN thin films. The observation of the nonlinear refractive index saturation in the intensity-dependent RZ-scan measurement indicates the existence of the fifth-order effect. By the aid of the TZ-scan, the fifth-order nonlinear effect has been enhanced by enlarging the cascaded contribution from the increased laser interaction length, where large n2 of −2.5×10−11cm2∕W and n4 of 2.1×10−19cm4∕W2 have been determined.