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A simple and accurate method to determine the third-order nonlinear susceptibility of thin films

✍ Scribed by Kenjiro Miyano; Takeshi Nishiwaki; Akihiro Tomioka

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 491 KB
Volume: 91
Category: Article
ISSN: 0030-4018
DOI: 10.1016/0030-4018(92)90378-5

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