Determination of the third- and fifth-or
โ
Zhang, Z. Q.; He, W. Q.; Gu, C. M.; Shen, W. Z.; Ogawa, H.; Guo, Q. X.
๐
Article
๐
2007
๐
American Institute of Physics
๐
English
โ 448 KB
We have combined the reflection and transmission Z-scan (RZ- and TZ-scans) techniques under femtosecond laser at 800nm to extract both the third- and fifth-order nonlinear refractive indices (n2 and n4) in InN thin films. The observation of the nonlinear refractive index saturation in the intensity-