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Determination of the third- and fifth-order nonlinear refractive indices in InN thin films

โœ Scribed by Zhang, Z. Q.; He, W. Q.; Gu, C. M.; Shen, W. Z.; Ogawa, H.; Guo, Q. X.


Book ID
120466076
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
448 KB
Volume
91
Category
Article
ISSN
0003-6951

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Determination of the third- and fifth-or
โœ Zhang, Z. Q.; He, W. Q.; Gu, C. M.; Shen, W. Z.; Ogawa, H.; Guo, Q. X. ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› American Institute of Physics ๐ŸŒ English โš– 448 KB

We have combined the reflection and transmission Z-scan (RZ- and TZ-scans) techniques under femtosecond laser at 800nm to extract both the third- and fifth-order nonlinear refractive indices (n2 and n4) in InN thin films. The observation of the nonlinear refractive index saturation in the intensity-