## Abstract The quantitative analysis of single crystals of polyethylene with the twoโbeam interference microscope has been described. The thickness of single crystals formed at 87ยฐC. is 134 A. The variation thickness is equal or less than 6 A. A general pattern of growth is discussed.
โฆ LIBER โฆ
Determination of the impurity nonuniformity of semiconductor single crystals by interference microscopy
โ Scribed by V. S. Rondarev
- Publisher
- Springer US
- Year
- 1982
- Tongue
- English
- Weight
- 100 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0543-1972
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