✦ LIBER ✦
X-Ray-Interferometric Determination of Å-scale Lattice Shifts at the Surface of Silicon Crystals — the Analogue to Light-Optical Interference Microscopy
✍ Scribed by Dr. M. Bartscher; U. Bonse
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 223 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0232-1300
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