𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Determination of the efficiency of electron capture center parameters in the MOS structure dielectric layer

✍ Scribed by N. I. Gavrilin; G. N. Demidova; É. N. Zhuravlev


Publisher
Springer US
Year
1982
Tongue
English
Weight
203 KB
Volume
25
Category
Article
ISSN
0543-1972

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES