✦ LIBER ✦

Determination of Si/SiO2 interfacial roughness using weak localization

✍ Scribed by W.R. Anderson; D.R. Lombardi; P.H. Mitev; T.P. Ma; R.G. Wheeler

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of Si/SiO/sub 2/ interface

✍ Anderson, W.R.; Lombardi, D.R.; Wheeler, R.G.; Ma, T.-P. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 314 KB

Determination of the SiO_2/Si interface

✍ Roos, A. ;Bergkvist, M. ;Ribbing, C. G. 📂 Article 📅 1988 🏛 The Optical Society 🌐 English ⚖ 509 KB

Determination of the SiO_2/Si interface

✍ Roos, A. ;Bergkvist, M. ;Ribbing, C. G. 📂 Article 📅 1988 🏛 The Optical Society 🌐 English ⚖ 534 KB

Determination of tunnel mass and physica

✍ Watanabe, H.; Matsushita, D.; Muraoka, K. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 496 KB

Fine Tuning of Au/SiO2/Si Diodes by Vary

✍ Y. Selzer; D. Cahen 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 172 KB

Complete determination of the electrical

✍ G. Pananakakis; G. Kamarinos 📂 Article 📅 1986 🏛 Elsevier Science ⚖ 48 KB