✦ LIBER ✦

Determination of tunnel mass and physical thickness of gate oxide including poly-Si/SiO2 and Si/SiO2 interfacial transition Layers

✍ Scribed by Watanabe, H.; Matsushita, D.; Muraoka, K.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of tunnelling parameters i

✍ M Depas; B Vermeire; P.W Mertens; R.L Van Meirhaeghe; M.M Heyns 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 709 KB

Chemical and electronic structure of SiO

✍ T Hattori; K Takahashi; M.B Seman; H Nohira; K Hirose; N Kamakura; Y Takata; S S 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 276 KB

Characterization and modeling of the tun

✍ Andrea Ghetti 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 283 KB