Determination of the interface state den
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N. Tuğluoğlu; F. Yakuphanoglu; S. Karadeniz
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Article
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2007
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Elsevier Science
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English
⚖ 339 KB
The electrical characterization of the In/p-Si Schottky diode has been investigated by conductance and capacitance-frequency techniques. The characteristic parameters of the interface states have been determined from the capacitance-frequency and conductance-frequency measurements. The capacitance o