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Determination of Residual Stresses in Titanium Carbide-Base Cermets by High-Temperature X-Ray Diffraction

✍ Scribed by HERBERT W. NEWKIRK JR.; HARRY H. SISLER


Book ID
110809373
Publisher
John Wiley and Sons
Year
1958
Tongue
English
Weight
1022 KB
Volume
41
Category
Article
ISSN
0002-7820

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A high temperature X-ray diffraction method based on the Laue (transmission) mode was developed to measure strains associated with the growth of an oxide scale on a metal. These growth strains in the attached oxide scale and metal substrate are determined simultaneously and in real time by the chang