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Measurement of residual stresses by X-ray diffraction in a NiNio system obtained by high temperature oxidation

✍ Scribed by A. Aubry; F. Armanet; G. Beranger; J.L. Lebrun; G. Maeder

Book ID
107709570
Publisher
Elsevier Science
Year
1988
Weight
991 KB
Volume
36
Category
Article
ISSN
0001-6160

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A high temperature X-ray diffraction method based on the Laue (transmission) mode was developed to measure strains associated with the growth of an oxide scale on a metal. These growth strains in the attached oxide scale and metal substrate are determined simultaneously and in real time by the chang