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Determination of Nitrogen Concentrations in (111) Oriented VPE-GaP Epitaxial Layers by Measurement of the Precision Lattice Parameter

✍ Scribed by Brühl, H.-G. ;Bąk, J.

Publisher
John Wiley and Sons
Year
1982
Tongue
English
Weight
343 KB
Volume
73
Category
Article
ISSN
0031-8965

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📜 SIMILAR VOLUMES

Precision lattice parameter measurements
Precision lattice parameter measurements of VPE-GaP-epitaxial layers by the „Umweganregung” method
✍ Dr. H.-G. Brühl 📂 Article 📅 1978 🏛 John Wiley and Sons 🌐 English ⚖ 268 KB 👁 1 views

## Precision Lattice Parameter Measurements of WE-Gap-Epitaxial Layers by the Wmweganregung" Method The "Umweganregung" technique according to a method described by SPOONER and WIL-SON was used for the accurate measurement of lattice parameters of (100) slice of VPEgrown layers of gallium phosphid

Determination of Nitrogen Concentration
Determination of Nitrogen Concentration in GaP Epitaxial Layers by Two Independent Methods
✍ T. Hänsel; Dr. H.-G. Brühl; Dr. R. Bindemann; Dr. W. Seifert; Dr. K. Jacobs 📂 Article 📅 1979 🏛 John Wiley and Sons 🌐 English ⚖ 519 KB

## Determination of Nitrogen Concentration in Gap Epitaxial Layers by Two Independent Methods The nitrogen concentration in GaP is determined by optical absorption in the A-line a t T = 77 K. The concentration of the isolated nitrogen atoms is given for T = 77 K by the modified LIOHTOWLERS' relati