𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Determination of elastic modulus of a beam by using electronic speckle pattern interferometry

✍ Scribed by Naseem Akhter; Hyun-Chul Jung; Ho-Seob Chang; Kyeong-Suk Kim

Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
606 KB
Volume
41
Category
Article
ISSN
0030-3992

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of the dynamics of restore
Determination of the dynamics of restored teeth by 3D electronic speckle pattern interferometry
✍ H. Lang; M. Rampado; R. Müllejans; W.H.-M. Raab 📂 Article 📅 2004 🏛 John Wiley and Sons 🌐 English ⚖ 392 KB

## Abstract ## Background and Objectives The difficulties typically encountered in studying the effects of restorations on tooth reinforcement are often due to the 3‐dimensional (3D) nature of deformation. Therefore, electronic 3D‐Speckle‐Interferometry (3D‐ESPI) was used to assess the impact of d

Elastic properties of adhesive polymers.
Elastic properties of adhesive polymers. I. Polymer films by means of electronic speckle pattern interferometry
✍ Johannes Konnerth; Wolfgang Gindl; Ulrich Müller 📂 Article 📅 2006 🏛 John Wiley and Sons 🌐 English ⚖ 283 KB 👁 1 views

## Abstract The elastic modulus and Poisson's ratio of seven different polymers frequently used as wood adhesives and/or matrix polymers in wood‐ and natural‐fibre‐reinforced composites, respectively, were determined by means of tensile tests. Specimen deformation during testing was measured by mea

Measurement of thin film thickness by el
Measurement of thin film thickness by electronic speckle pattern interferometry
✍ Canan Karaaliog̃lu; Yani Skarlatos 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 362 KB

The surface profile of an Al thin film and its thickness have been observed by electronic speckle pattern interferometry (ESPI). The Michelson interferometer was used as our basic interferometric system to obtain interference fringes on a CCD camera. These interference fringes, arising from the path