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Determination of doping concentration and interface charges for thin film SOI MOSFETs

✍ Scribed by Sung-Kye Park; Choong-Ki Kim

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 535 KB
Volume: 36
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(93)90243-j

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