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Three-interface pseudo-MOSFET models for the characterization of SOI wafers with ultrathin film and BOX

✍ Scribed by Noel Rodriguez; Sorin Cristoloveanu; Mariazel Maqueda; Francisco Gámiz; Frederic Allibert


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
626 KB
Volume
88
Category
Article
ISSN
0167-9317

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