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Determination of conductor loss of multilayer-coupled microstrip lines for CAD application

✍ Scribed by A. K. Verma; Nasimuddin

Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
159 KB
Volume
38
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

By modifying and adopting the incremental inductance rule, in association with the variational method in the Fourier domain, and using the single layer (SLR) formulation, we present a fast and accurate method to compute the conductor loss of a multilayer‐coupled microstrip line with and without shield. The accuracy of the method has been tested against several full‐wave methods. The conductor loss of many useful structures is compared. The method is valid for conductor thickness t > 1.11 skin depth. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 409–415, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11076

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