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Determination and Study of Field Dependent Defect Density in Thermal SiO2 Using 1,1,1 Trichloroethane (TCA)

✍ Scribed by Bhan, R. K. ;Lomash, S. K. ;Chhabra, K. C.

Publisher: John Wiley and Sons
Year: 1990
Tongue: English
Weight: 617 KB
Volume: 117
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211170121

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