𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Detection of thin surface films by electron probe microanalysis in dependence on the substrate

✍ Scribed by Wendt, M.

Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
177 KB
Volume
56
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

A comparison of the composition of thin
A comparison of the composition of thin films on substrates determined by EDX and surface analysis
✍ A. G. Fitzgerald; A. D. Gillies; H. L. L. Watton πŸ“‚ Article πŸ“… 1990 πŸ› John Wiley and Sons 🌐 English βš– 406 KB

## Abstract Single‐scattering Monte Carlo electron trajectory simulation has been implemented for the calculation of characteristic x‐ray production in thin films on substrates. The validity of the simulation has been verified by comparison with EDX results from various thicknesses of gold and silv