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Detection of thin surface films by electron beam microanalysis. A comparison between wavelength-dispersive and energy-dispersive microprobes

✍ Scribed by Wendt, M. ;Krajewski, Th. ;Bimberg, R.

Publisher: John Wiley and Sons
Year: 1976
Tongue: English
Weight: 541 KB
Volume: 36
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210360127

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