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Detecting a disturbed layer on a silicon surface by means of monochromatic null ellipsometry

✍ Scribed by Ayupov, B. M.; Kozlova, N. A.

Book ID
115401869
Publisher
Optical Society of America
Year
2006
Tongue
English
Weight
133 KB
Volume
73
Category
Article
ISSN
1070-9762

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✍ Dimitrios Stroumpoulis; Alejandro Parra; Matthew Tirrell πŸ“‚ Article πŸ“… 2006 πŸ› American Institute of Chemical Engineers 🌐 English βš– 206 KB πŸ‘ 2 views

## Abstract Ellipsometry and a mass transport model were used to investigate the kinetics of lipid bilayer formation on silicon dioxide surfaces from 100 nm diameter 1,2‐dimyristoyl‐sn‐glycero‐3‐phosphocholine (DMPC) vesicles. For the range of concentrations studied, 0.025 to 0.380 mg/mL, the rate