Design of solder joints for fundamental studies on the effects of electromigration
β Scribed by C. E. Ho; A. Lee; K. N. Subramanian
- Publisher
- Springer US
- Year
- 2007
- Tongue
- English
- Weight
- 516 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0957-4522
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π SIMILAR VOLUMES
The polarity effect of electromigration on the interfacial reactions of micro ball grid array (lBGA) solder joints was studied in terms of microstructural evolution. A dummy lBGA package with the same pair of solder joints was used to obtain reproducible results for a practical application. The lBGA
A BGA package warping produced hybrid deformations in the solder joint interconnections. This situation creates difficult challenges in avoiding certain mechanical failure problems and even maintaining acceptable electrical performance in the electronic package. Accessing electronic circuit simulati
As the electronics industry is moving towards lead-free manufacturing processes, more effort has been put into the reliability study of lead-free solder materials. Various tin-silver-copper-based solders have become widely accepted alternatives for tin-lead solders. In this study, we have tested thr