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Design of Compact ESD Protection Circuit for V-Band RF Applications in a 65-nm CMOS Technology

✍ Scribed by Chun-Yu Lin, ; Li-Wei Chu, ; Shiang-Yu Tsai, ; Ming-Dou Ker,

Book ID: 121467325
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 842 KB
Volume: 12
Category: Article
ISSN: 1530-4388
DOI: 10.1109/TDMR.2012.2188405

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