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[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology

✍ Scribed by Chu, Li-Wei; Lin, Chun-Yu; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng

Book ID: 121336592
Publisher: IEEE
Year: 2012
Weight: 987 KB
Category: Article
ISBN: 1467302171
DOI: 10.1109/ISCAS.2012.6271706

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